Tender Details

Country: Finland
Summary: A Combined Focused-Ion Beam / Scanning Electron Microscope Fib-Sem
FIT Ref No: 72971868
Deadline: 11 Nov 2022
Financier: Self Financed
Purchaser Ownership: Government
Tender Value: Refer Document
Notice Type: Tender
Document Ref. No.: 558521-2022
Purchaser's Detail:
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Description:
The object of the tender process is a combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber (later also “Equipment”). A combined focused-ion beam / scanning electron microscope (FIB-SEM) equipped with field-emission gun (FEG) electron source, state-of-the-art detector system, and equipment suitable for materials in-situ testing inside the microscope chamber. The electron beam should operate flexile from 0.5 kV to 30 kV with reasonable beam currents for analyses. The ion beam system should operate similarly in a flexible manner up to 30 kV and provide adequate resolution and milling rates for the materials, which are mainly steels. Automated ion milling software should be included with possibilities to perform 3D examinations and to pre-fabricate specimens for high-end techniques such as Atom Probe Tomography (APT) and Transmission Electron Microscopy (TEM). The FIB-SEM system should provide fast high-quality detectors for the techniques that are mostly applied: Energy Dispersive X-ray Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Electron Channeling Contrast Imaging (ECCI) investigations. The technical specification of the equipment and the tender process to be supplied is discussed in more detail in the invitation to tender documents.
Doc Title: Electron microscopes ...
Documents:

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A Combined Focused-Ion Beam / Scanning Electron Microscope Fib-Sem - Finland Tender

The VTT TECHNICAL RESEARCH CENTRE OF FINLAND LTD, a Government sector organization in Finland, has announced a new tender for A Combined Focused-Ion Beam / Scanning Electron Microscope Fib-Sem. This tender is published on FinlandTenders under FIT Ref No: 72971868 and is categorized as a Tender. Interested and eligible suppliers are invited to participate by reviewing the tender documents and submitting their bids before the deadline on 2022-11-11.

The estimated tender value is Refer Document, and full details, including technical specifications and submission requirements, are provided in the official tender documents. Ensure all submissions meet the criteria outlined to be considered for evaluation.